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smartctl 5.41 2011-06-09 r3365 [x86_64-linux-3.2.0-59-generic] (local build)
Copyright (C) 2002-11 by Bruce Allen, http://smartmontools.sourceforge.net

=== START OF INFORMATION SECTION ===
Model Family:     Seagate Barracuda ES.2
Device Model:     ST31000340NS
Serial Number:    9QJ08FH5
LU WWN Device Id: 5 000c50 009b42004
Firmware Version: SN06
User Capacity:    1,000,204,886,016 bytes [1.00 TB]
Sector Size:      512 bytes logical/physical
Device is:        In smartctl database [for details use: -P show]
ATA Version is:   8
ATA Standard is:  ATA-8-ACS revision 4
Local Time is:    Fri Jan 30 12:52:54 2015 MST
SMART support is: Available - device has SMART capability.
SMART support is: Enabled

=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED

General SMART Values:
Offline data collection status:  (0x82)	Offline data collection activity
					was completed without error.
					Auto Offline Data Collection: Enabled.
Self-test execution status:      (   0)	The previous self-test routine completed
					without error or no self-test has ever 
					been run.
Total time to complete Offline 
data collection: 		(  642) seconds.
Offline data collection
capabilities: 			 (0x7b) SMART execute Offline immediate.
					Auto Offline data collection on/off support.
					Suspend Offline collection upon new
					command.
					Offline surface scan supported.
					Self-test supported.
					Conveyance Self-test supported.
					Selective Self-test supported.
SMART capabilities:            (0x0003)	Saves SMART data before entering
					power-saving mode.
					Supports SMART auto save timer.
Error logging capability:        (0x01)	Error logging supported.
					General Purpose Logging supported.
Short self-test routine 
recommended polling time: 	 (   1) minutes.
Extended self-test routine
recommended polling time: 	 ( 226) minutes.
Conveyance self-test routine
recommended polling time: 	 (   2) minutes.
SCT capabilities: 	       (0x103d)	SCT Status supported.
					SCT Error Recovery Control supported.
					SCT Feature Control supported.
					SCT Data Table supported.

SMART Attributes Data Structure revision number: 10
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME          FLAG     VALUE WORST THRESH TYPE      UPDATED  WHEN_FAILED RAW_VALUE
  1 Raw_Read_Error_Rate     0x000f   081   068   006    Pre-fail  Always       -       148326869
  3 Spin_Up_Time            0x0003   099   098   000    Pre-fail  Always       -       0
  4 Start_Stop_Count        0x0032   100   100   020    Old_age   Always       -       72
  5 Reallocated_Sector_Ct   0x0033   100   100   036    Pre-fail  Always       -       0
  7 Seek_Error_Rate         0x000f   060   054   030    Pre-fail  Always       -       408116628499
  9 Power_On_Hours          0x0032   054   054   000    Old_age   Always       -       40324
 10 Spin_Retry_Count        0x0013   100   100   097    Pre-fail  Always       -       0
 12 Power_Cycle_Count       0x0032   100   037   020    Old_age   Always       -       51
184 End-to-End_Error        0x0032   100   100   099    Old_age   Always       -       0
187 Reported_Uncorrect      0x0032   100   100   000    Old_age   Always       -       0
188 Command_Timeout         0x0032   100   100   000    Old_age   Always       -       0
189 High_Fly_Writes         0x003a   100   100   000    Old_age   Always       -       0
190 Airflow_Temperature_Cel 0x0022   072   050   045    Old_age   Always       -       28 (Min/Max 26/29)
194 Temperature_Celsius     0x0022   028   050   000    Old_age   Always       -       28 (0 20 0 0)
195 Hardware_ECC_Recovered  0x001a   021   021   000    Old_age   Always       -       148326869
197 Current_Pending_Sector  0x0012   100   100   000    Old_age   Always       -       0
198 Offline_Uncorrectable   0x0010   100   100   000    Old_age   Offline      -       0
199 UDMA_CRC_Error_Count    0x003e   200   200   000    Old_age   Always       -       0

SMART Error Log Version: 1
ATA Error Count: 4
	CR = Command Register [HEX]
	FR = Features Register [HEX]
	SC = Sector Count Register [HEX]
	SN = Sector Number Register [HEX]
	CL = Cylinder Low Register [HEX]
	CH = Cylinder High Register [HEX]
	DH = Device/Head Register [HEX]
	DC = Device Command Register [HEX]
	ER = Error register [HEX]
	ST = Status register [HEX]
Powered_Up_Time is measured from power on, and printed as
DDd+hh:mm:SS.sss where DD=days, hh=hours, mm=minutes,
SS=sec, and sss=millisec. It "wraps" after 49.710 days.

Error 4 occurred at disk power-on lifetime: 8411 hours (350 days + 11 hours)
  When the command that caused the error occurred, the device was active or idle.

  After command completion occurred, registers were:
  ER ST SC SN CL CH DH
  -- -- -- -- -- -- --
  08 51 00 00 00 00 00  Error: 

  Commands leading to the command that caused the error were:
  CR FR SC SN CL CH DH DC   Powered_Up_Time  Command/Feature_Name
  -- -- -- -- -- -- -- --  ----------------  --------------------
  2f 00 02 ff ff ff 0f 00      00:08:52.833  READ LOG EXT
  3f 00 01 ff ff ff 0f 00      00:08:52.831  WRITE LOG EXT
  ef 03 45 00 00 00 00 00      00:08:52.781  SET FEATURES [Set transfer mode]
  00 00 00 00 00 00 00 04      00:08:52.732  NOP [Abort queued commands]
  2f 00 01 ff ff ff 0f 00      00:08:52.471  READ LOG EXT

Error 3 occurred at disk power-on lifetime: 8411 hours (350 days + 11 hours)
  When the command that caused the error occurred, the device was active or idle.

  After command completion occurred, registers were:
  ER ST SC SN CL CH DH
  -- -- -- -- -- -- --
  08 51 00 00 00 00 00  Error: 

  Commands leading to the command that caused the error were:
  CR FR SC SN CL CH DH DC   Powered_Up_Time  Command/Feature_Name
  -- -- -- -- -- -- -- --  ----------------  --------------------
  2f 00 01 ff ff ff 0f 00      00:08:52.471  READ LOG EXT
  3f 00 01 ff ff ff 0f 00      00:08:52.470  WRITE LOG EXT
  92 03 01 00 00 00 a0 00      00:03:22.496  DOWNLOAD MICROCODE [Reserved subcommand]
  ec 00 01 00 00 00 00 00      00:03:22.492  IDENTIFY DEVICE
  ef 03 45 00 00 00 00 00      00:03:22.442  SET FEATURES [Set transfer mode]

Error 2 occurred at disk power-on lifetime: 8411 hours (350 days + 11 hours)
  When the command that caused the error occurred, the device was active or idle.

  After command completion occurred, registers were:
  ER ST SC SN CL CH DH
  -- -- -- -- -- -- --
  08 51 00 00 00 00 00  Error: 

  Commands leading to the command that caused the error were:
  CR FR SC SN CL CH DH DC   Powered_Up_Time  Command/Feature_Name
  -- -- -- -- -- -- -- --  ----------------  --------------------
  2f 00 02 ff ff ff 0f 00      00:03:22.133  READ LOG EXT
  3f 00 01 ff ff ff 0f 00      00:03:22.122  WRITE LOG EXT
  ef 03 45 00 00 00 00 00      00:03:22.072  SET FEATURES [Set transfer mode]
  00 00 00 00 00 00 00 04      00:03:22.019  NOP [Abort queued commands]
  2f 00 01 ff ff ff 0f 00      00:03:21.757  READ LOG EXT

Error 1 occurred at disk power-on lifetime: 8411 hours (350 days + 11 hours)
  When the command that caused the error occurred, the device was active or idle.

  After command completion occurred, registers were:
  ER ST SC SN CL CH DH
  -- -- -- -- -- -- --
  08 51 00 00 00 00 00  Error: 

  Commands leading to the command that caused the error were:
  CR FR SC SN CL CH DH DC   Powered_Up_Time  Command/Feature_Name
  -- -- -- -- -- -- -- --  ----------------  --------------------
  2f 00 01 ff ff ff 0f 00      00:03:21.757  READ LOG EXT
  3f 00 01 ff ff ff 0f 00      00:03:21.756  WRITE LOG EXT
  42 00 10 ff ff ff 4f 00      00:00:30.157  READ VERIFY SECTOR(S) EXT
  60 00 10 ff ff ff 4f 00      00:00:30.147  READ FPDMA QUEUED
  b0 da 00 00 4f c2 a0 00      00:00:30.115  SMART RETURN STATUS

SMART Self-test log structure revision number 1
No self-tests have been logged.  [To run self-tests, use: smartctl -t]


SMART Selective self-test log data structure revision number 1
 SPAN  MIN_LBA  MAX_LBA  CURRENT_TEST_STATUS
    1        0        0  Not_testing
    2        0        0  Not_testing
    3        0        0  Not_testing
    4        0        0  Not_testing
    5        0        0  Not_testing
Selective self-test flags (0x0):
  After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.
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