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189 | smartctl 6.5 2016-01-24 r4214 [x86_64-linux-4.4.0-72-generic] (local build)
Copyright (C) 2002-16, Bruce Allen, Christian Franke, www.smartmontools.org
=== START OF INFORMATION SECTION ===
Model Family: Western Digital Elements / My Passport (USB, AF)
Device Model: WDC WD10JMVW-11AJGS0
Serial Number: WD-WX41A8349442
LU WWN Device Id: 5 0014ee 2b3b726da
Firmware Version: 01.01A01
User Capacity: 1,000,204,886,016 bytes [1.00 TB]
Sector Sizes: 512 bytes logical, 4096 bytes physical
Rotation Rate: 5400 rpm
Device is: In smartctl database [for details use: -P show]
ATA Version is: ACS-2 (minor revision not indicated)
SATA Version is: SATA 3.0, 3.0 Gb/s (current: 3.0 Gb/s)
Local Time is: Mon Jun 19 13:21:54 2017 WAT
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
=== START OF READ SMART DATA SECTION ===
SMART Status not supported: Incomplete response, ATA output registers missing
SMART overall-health self-assessment test result: PASSED
Warning: This result is based on an Attribute check.
General SMART Values:
Offline data collection status: (0x00) Offline data collection activity
was never started.
Auto Offline Data Collection: Disabled.
Self-test execution status: ( 0) The previous self-test routine completed
without error or no self-test has ever
been run.
Total time to complete Offline
data collection: (19260) seconds.
Offline data collection
capabilities: (0x7b) SMART execute Offline immediate.
Auto Offline data collection on/off support.
Suspend Offline collection upon new
command.
Offline surface scan supported.
Self-test supported.
Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 2) minutes.
Extended self-test routine
recommended polling time: ( 215) minutes.
Conveyance self-test routine
recommended polling time: ( 5) minutes.
SCT capabilities: (0x7035) SCT Status supported.
SCT Feature Control supported.
SCT Data Table supported.
SMART Attributes Data Structure revision number: 16
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_FAILED RAW_VALUE
1 Raw_Read_Error_Rate 0x002f 200 200 051 Pre-fail Always - 0
3 Spin_Up_Time 0x0027 133 131 021 Pre-fail Always - 4333
4 Start_Stop_Count 0x0032 100 100 000 Old_age Always - 78
5 Reallocated_Sector_Ct 0x0033 200 200 140 Pre-fail Always - 0
7 Seek_Error_Rate 0x002e 113 113 000 Old_age Always - 781
9 Power_On_Hours 0x0032 100 100 000 Old_age Always - 35
10 Spin_Retry_Count 0x0032 100 253 000 Old_age Always - 0
11 Calibration_Retry_Count 0x0032 100 253 000 Old_age Always - 0
12 Power_Cycle_Count 0x0032 100 100 000 Old_age Always - 52
192 Power-Off_Retract_Count 0x0032 200 200 000 Old_age Always - 36
193 Load_Cycle_Count 0x0032 200 200 000 Old_age Always - 499
194 Temperature_Celsius 0x0022 114 105 000 Old_age Always - 33
196 Reallocated_Event_Count 0x0032 200 200 000 Old_age Always - 0
197 Current_Pending_Sector 0x0032 200 200 000 Old_age Always - 51
198 Offline_Uncorrectable 0x0030 100 253 000 Old_age Offline - 0
199 UDMA_CRC_Error_Count 0x0032 200 200 000 Old_age Always - 0
200 Multi_Zone_Error_Rate 0x0008 100 253 000 Old_age Offline - 0
SMART Error Log Version: 1
ATA Error Count: 12 (device log contains only the most recent five errors)
CR = Command Register [HEX]
FR = Features Register [HEX]
SC = Sector Count Register [HEX]
SN = Sector Number Register [HEX]
CL = Cylinder Low Register [HEX]
CH = Cylinder High Register [HEX]
DH = Device/Head Register [HEX]
DC = Device Command Register [HEX]
ER = Error register [HEX]
ST = Status register [HEX]
Powered_Up_Time is measured from power on, and printed as
DDd+hh:mm:SS.sss where DD=days, hh=hours, mm=minutes,
SS=sec, and sss=millisec. It "wraps" after 49.710 days.
Error 12 occurred at disk power-on lifetime: 35 hours (1 days + 11 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
04 51 02 00 00 00 00
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
e1 00 02 00 00 00 00 00 00:09:13.232 IDLE IMMEDIATE
ec 00 01 00 00 00 00 00 00:09:13.231 IDENTIFY DEVICE
b0 d0 00 00 4f c2 00 00 00:09:02.400 SMART READ DATA
Error 11 occurred at disk power-on lifetime: 35 hours (1 days + 11 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
04 51 02 00 00 00 00
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
e1 00 02 00 00 00 00 00 00:04:54.197 IDLE IMMEDIATE
ec 00 01 00 00 00 00 00 00:04:54.196 IDENTIFY DEVICE
e1 00 0f 00 00 00 00 00 00:04:49.181 IDLE IMMEDIATE
e1 00 02 00 00 00 00 00 00:04:47.875 IDLE IMMEDIATE
ec 00 01 00 00 00 00 00 00:04:47.874 IDENTIFY DEVICE
Error 10 occurred at disk power-on lifetime: 35 hours (1 days + 11 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
04 51 0f 00 00 00 00
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
e1 00 0f 00 00 00 00 00 00:04:49.181 IDLE IMMEDIATE
e1 00 02 00 00 00 00 00 00:04:47.875 IDLE IMMEDIATE
ec 00 01 00 00 00 00 00 00:04:47.874 IDENTIFY DEVICE
e1 00 0f 00 00 00 00 00 00:04:42.888 IDLE IMMEDIATE
e1 00 02 00 00 00 00 00 00:04:41.479 IDLE IMMEDIATE
Error 9 occurred at disk power-on lifetime: 35 hours (1 days + 11 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
04 51 02 00 00 00 00
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
e1 00 02 00 00 00 00 00 00:04:47.875 IDLE IMMEDIATE
ec 00 01 00 00 00 00 00 00:04:47.874 IDENTIFY DEVICE
e1 00 0f 00 00 00 00 00 00:04:42.888 IDLE IMMEDIATE
e1 00 02 00 00 00 00 00 00:04:41.479 IDLE IMMEDIATE
ec 00 01 00 00 00 00 00 00:04:41.478 IDENTIFY DEVICE
Error 8 occurred at disk power-on lifetime: 35 hours (1 days + 11 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
04 51 0f 00 00 00 00
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
e1 00 0f 00 00 00 00 00 00:04:42.888 IDLE IMMEDIATE
e1 00 02 00 00 00 00 00 00:04:41.479 IDLE IMMEDIATE
ec 00 01 00 00 00 00 00 00:04:41.478 IDENTIFY DEVICE
ec 00 01 00 00 00 00 00 00:03:36.261 IDENTIFY DEVICE
SMART Self-test log structure revision number 1
No self-tests have been logged. [To run self-tests, use: smartctl -t]
SMART Selective self-test log data structure revision number 1
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Not_testing
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.
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