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199 | === START OF INFORMATION SECTION ===
Model Family: Seagate Barracuda 7200.11
Device Model: ST3500320AS
Serial Number: 5QM1XYGB
LU WWN Device Id: 5 000c50 00cf2e28b
Firmware Version: SD15
User Capacity: 500.106.780.160 bytes [500 GB]
Sector Size: 512 bytes logical/physical
Rotation Rate: 7200 rpm
Device is: In smartctl database [for details use: -P show]
ATA Version is: ATA8-ACS T13/1699-D revision 4
SATA Version is: SATA 2.6, 1.5 Gb/s
Local Time is: Fri Jun 26 14:38:03 2015 CEST
==> WARNING: There are known problems with these drives,
THIS DRIVE MAY OR MAY NOT BE AFFECTED,
see the following web pages for details:
http://knowledge.seagate.com/articles/en_US/FAQ/207931en
http://knowledge.seagate.com/articles/en_US/FAQ/207951en
http://bugs.debian.org/cgi-bin/bugreport.cgi?bug=632758
SMART support is: Available - device has SMART capability.
SMART support is: Disabled
=== START OF ENABLE/DISABLE COMMANDS SECTION ===
SMART Enabled.
=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED
General SMART Values:
Offline data collection status: (0x82) Offline data collection activity
was completed without error.
Auto Offline Data Collection: Enabled.
Self-test execution status: ( 25) The self-test routine was aborted by
the host.
Total time to complete Offline
data collection: ( 642) seconds.
Offline data collection
capabilities: (0x7b) SMART execute Offline immediate.
Auto Offline data collection on/off support.
Suspend Offline collection upon new
command.
Offline surface scan supported.
Self-test supported.
Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 1) minutes.
Extended self-test routine
recommended polling time: ( 117) minutes.
Conveyance self-test routine
recommended polling time: ( 2) minutes.
SCT capabilities: (0x103b) SCT Status supported.
SCT Error Recovery Control supported.
SCT Feature Control supported.
SCT Data Table supported.
SMART Attributes Data Structure revision number: 10
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_FAILED RAW_VALUE
1 Raw_Read_Error_Rate 0x000f 112 090 006 Pre-fail Always - 45309984
3 Spin_Up_Time 0x0003 094 094 000 Pre-fail Always - 0
4 Start_Stop_Count 0x0032 098 098 020 Old_age Always - 2116
5 Reallocated_Sector_Ct 0x0033 100 100 036 Pre-fail Always - 1266
7 Seek_Error_Rate 0x000f 077 060 030 Pre-fail Always - 21732927237
9 Power_On_Hours 0x0032 069 069 000 Old_age Always - 27488
10 Spin_Retry_Count 0x0013 100 100 097 Pre-fail Always - 2
12 Power_Cycle_Count 0x0032 097 097 020 Old_age Always - 3328
184 End-to-End_Error 0x0032 100 100 099 Old_age Always - 0
187 Reported_Uncorrect 0x0032 001 001 000 Old_age Always - 3061
188 Command_Timeout 0x0032 099 094 000 Old_age Always - 957792649854
189 High_Fly_Writes 0x003a 001 001 000 Old_age Always - 106
190 Airflow_Temperature_Cel 0x0022 069 051 045 Old_age Always - 31 (Min/Max 31/31)
194 Temperature_Celsius 0x0022 031 049 000 Old_age Always - 31 (0 5 0 0 0)
195 Hardware_ECC_Recovered 0x001a 030 017 000 Old_age Always - 45309984
197 Current_Pending_Sector 0x0012 100 100 000 Old_age Always - 491
198 Offline_Uncorrectable 0x0010 100 100 000 Old_age Offline - 491
199 UDMA_CRC_Error_Count 0x003e 200 200 000 Old_age Always - 0
SMART Error Log Version: 1
ATA Error Count: 3839 (device log contains only the most recent five errors)
CR = Command Register [HEX]
FR = Features Register [HEX]
SC = Sector Count Register [HEX]
SN = Sector Number Register [HEX]
CL = Cylinder Low Register [HEX]
CH = Cylinder High Register [HEX]
DH = Device/Head Register [HEX]
DC = Device Command Register [HEX]
ER = Error register [HEX]
ST = Status register [HEX]
Powered_Up_Time is measured from power on, and printed as
DDd+hh:mm:SS.sss where DD=days, hh=hours, mm=minutes,
SS=sec, and sss=millisec. It "wraps" after 49.710 days.
Error 3839 occurred at disk power-on lifetime: 27404 hours (1141 days + 20 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
40 51 00 2f 67 4c 03 Error: UNC at LBA = 0x034c672f = 55338799
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
c8 00 08 2f 67 4c e3 00 04:22:36.164 READ DMA
25 00 08 ff ff ff ef 00 04:22:36.138 READ DMA EXT
35 00 d8 ff ff ff ef 00 04:22:36.114 WRITE DMA EXT
27 00 00 00 00 00 e0 00 04:22:36.113 READ NATIVE MAX ADDRESS EXT [OBS-ACS-3]
ec 00 00 00 00 00 a0 00 04:22:36.110 IDENTIFY DEVICE
Error 3838 occurred at disk power-on lifetime: 27404 hours (1141 days + 20 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
40 51 00 2f 67 4c 03 Error: UNC at LBA = 0x034c672f = 55338799
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
c8 00 08 2f 67 4c e3 00 04:22:33.162 READ DMA
c8 00 70 df 05 03 e4 00 04:22:31.829 READ DMA
c8 00 58 7f 05 03 e4 00 04:22:31.828 READ DMA
c8 00 20 4f 05 03 e4 00 04:22:31.828 READ DMA
c8 00 18 1f 05 03 e4 00 04:22:31.828 READ DMA
Error 3837 occurred at disk power-on lifetime: 27404 hours (1141 days + 20 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
40 51 00 2f 67 4c 03 Error: UNC at LBA = 0x034c672f = 55338799
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
c8 00 10 27 67 4c e3 00 03:50:03.579 READ DMA
25 00 08 ff ff ff ef 00 03:50:03.494 READ DMA EXT
25 00 08 ff ff ff ef 00 03:50:03.421 READ DMA EXT
ea 00 00 ff ff ff af 00 03:50:03.414 FLUSH CACHE EXT
35 00 08 ff ff ff ef 00 03:50:03.413 WRITE DMA EXT
Error 3836 occurred at disk power-on lifetime: 27394 hours (1141 days + 10 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
40 51 00 ee df ef 00 Error: UNC at LBA = 0x00efdfee = 15720430
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
c8 00 08 e7 df ef e0 00 00:21:07.475 READ DMA
25 00 10 ff ff ff ef 00 00:21:07.472 READ DMA EXT
25 00 e8 ff ff ff ef 00 00:21:07.458 READ DMA EXT
25 00 08 ff ff ff ef 00 00:21:07.457 READ DMA EXT
25 00 08 ff ff ff ef 00 00:21:07.444 READ DMA EXT
Error 3835 occurred at disk power-on lifetime: 27394 hours (1141 days + 10 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
40 51 00 ee df ef 00 Error: UNC at LBA = 0x00efdfee = 15720430
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
c8 00 08 e7 df ef e0 00 00:21:03.806 READ DMA
c8 00 08 97 de ef e0 00 00:21:03.804 READ DMA
25 00 60 ff ff ff ef 00 00:21:03.804 READ DMA EXT
25 00 28 ff ff ff ef 00 00:21:03.802 READ DMA EXT
25 00 08 ff ff ff ef 00 00:21:03.801 READ DMA EXT
SMART Self-test log structure revision number 1
No self-tests have been logged. [To run self-tests, use: smartctl -t]
SMART Selective self-test log data structure revision number 1
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Not_testing
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.
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